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A wafer VPD methodology provider you can trust

 

Wafer VPD Analysis

Accumulating years of experience, VISL is  a world leading company who develops reliable equipment using VPD methodology for wafer surface heavy metal contamination analysis.

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Contineuos research and development in such field is extending VISL to future analysis needs.  

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Awarded with patent-pending methodology, VISL offers analysis applications include wafer surface, wafer bulk, and wafer bevel. 

Visit

 

8233 SW Cirrus Drive, 16-J, Beaverton OR 97008

 

Call

 

 

Mobile: +1-503-583-3090​
 

Contact

 

yenchoo@vpdintegrationservice.com

vislyenchoo@gmail.com

© 2013 by ï»¿VPD Integration Service LLC.

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